Labmate Polarizing Microscope LMPM-802
Labmate Polarizing Microscope LMPM-802 features a 30° inclined binocular Siedentopf viewing head with high-eyepoint WF10X/20 eyepieces, providing a stable and ergonomic platform for precise analysis. It integrates strain-free plan achromatic objectives for transmitted and reflected systems, a rotatable analyzer, and high-intensity halogen illumination, delivering high-resolution, distortion-free imaging.
Product Info
Key Features
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30° inclined binocular Siedentopf head with dual diopters
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WF10X/20 eyepieces with crosshair and scale/grid options
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Backward quintuple center-adjustable nosepiece
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Strain-free plan achromatic objectives: 4X, 10X (reflected/transmitted); 20X, 40X, 60X (transmitted)
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Rotatable polarizer and analyzer (0°–360°)
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Optical compensators: λ slip, 1/4 λ, quartz wedge
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Abbe condenser NA0.9 with iris diaphragm
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Revolving round stage, φ160 mm, 1° increments, minimum resolution 6’
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Fine focusing system, 0.002 mm division, 24 mm range
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Bertrand lens, focus/center adjustable
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12V/50W halogen illumination, intensity adjustable
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Wide-field infinite optical system
Technical Highlights
Specification Details Viewing Head Binocular Siedentopf, 30° inclined Eyepiece WF10X/20 with crosshair and scale/grid options Nosepiece Backward quintuple, center adjustable Objectives 4X, 10X (transmitted/reflected), 20X, 40X, 60X (transmitted) Polarizer 360° rotatable Analyzer 360° rotatable, gradation 0°–360° Optical Compensator λ slip, 1/4 λ, quartz wedge Condenser Abbe NA0.9 with iris diaphragm Stage Revolving round φ160 mm, 1° increments Focusing System Coaxial coarse/fine, 0.002 mm precision, 24 mm range Bertrand Lens Focus/center adjustable sliding Illumination 12V/50W halogen, adjustable intensity Features Infinite optical system, wide-field eyepieces, strain-free objectives, center-adjustable nosepiece Applications
Labmate Polarizing Microscope LMPM-802 is suitable for clinical diagnostics, material science investigations, research institutions, and other advanced laboratory applications requiring high-precision optical analysis.-
