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Labmate Atomic Force Microscope LMAFM-A101

Labmate Atomic Force Microscope LMAFM-A101

Labmate Atomic Force Microscope LMAFM-A101 is a high-precision dual-mode microscope combining optical metallography and atomic force microscopy. It enables simultaneous 2D optical and 3D atomic force imaging, offering nanometer-level resolution with strong anti-interference performance. The integrated laser head and scanning stage provide stable measurements and nonlinear correction, making it ideal for advanced surface characterization in nanotechnology, material science, and related research fields.

  • Product Info

    Key Features

    • Dual-mode imaging: Optical metallography + Atomic Force Microscopy (AFM)

    • High-resolution scanning: XY 0.2 nm, Z 0.05 nm

    • XY scan range: 50 × 50 µm, Z scan range: 5 µm

    • Strong anti-interference design with spring suspension and metal shielding

    • Smart probe protection for sample and tip safety

    • Easy laser alignment for rapid setup

    • Ultra-high magnification for detailed surface analysis

    • USB 2.0/3.0 connectivity and Windows-compatible software

    Applications

    • Nanometer-scale imaging of graphite, gold clusters, polystyrene spheres, and polysaccharides

    • Surface morphology and material characterization in nanotechnology

    • Advanced research in material science, chemistry, and biophysics

    Technical Highlights

    Parameter Specification
    Operation Modes Contact, Tapping, Friction, Phase, Magnetic, Electrostatic
    Curves RMS-Z Curve, F-Z Force Curve
    XY Scan Range 50 × 50 µm
    XY Scan Resolution 0.2 nm
    Z Scan Range 5 µm
    Z Scan Resolution 0.05 nm
    Scan Speed 0.6–30 Hz
    Scan Angle 0°–360°
    Sample Size Capacity Ø ≤ 90 mm, H ≤ 20 mm
    XY Stage Movement 25 × 25 µm
    Shock-Absorbing Design Spring Suspension, Metal Shielding Box
    Output Interface USB 2.0 / 3.0
    Software Compatibility Windows XP / 7 / 8 / 10
    Instrument Dimensions (W×D×H) 700 × 480 × 450 mm
    Weight 75 kg

    Labmate LMAFM-A101 is ideal for researchers requiring dual-mode imaging and ultra-high-resolution surface analysis for nanomaterials, biomaterials, and advanced scientific studies.

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